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Join Nearfield Instruments and help shape the future of semiconductor manufacturing Chips are becoming smaller, more powerful, and increasingly complex. As a result, traditional metrology solutions are no longer…
Designs atomic-scale metrology systems for semiconductor manufacturing, balancing physics, mechatronics, and software into a single high-performance machine.
About Nearfield Instruments Nearfield Instruments (NFI) is a fast-growing, high-tech scale-up that designs, develops, integrates, markets, and services advanced semiconductor metrology solutions. Our instruments enable…
About Nearfield Instruments Nearfield Instruments (NFI) is a fast-growing, innovative deep-tech scale-up transforming semiconductor metrology. Our technology enables leading chipmakers to improve yield and device…
※日本語は下記参照 Position Overview As Application Manager Japan, you will play a central role in ensuring the successful implementation and adoption of NFI’s metrology applications across the Japanese market. In this…
About Nearfield Instruments Nearfield Instruments (NFI) is a fast-growing high-tech scale-up. We design, develop, integrate, market, and service advanced metrology systems. Our solutions enable the world’s leading…
※日本語は下記参照 Position Overview As a Field Application Engineer (FAE), you will play a critical role in bridging Nearfield's technology, customers, and internal development teams. You will be responsible for…
※日本語は下記参照 Position Overview As a Field Service Engineer, you will be responsible for ensuring the reliable operation of Nearfield's metrology systems installed at customer semiconductor fabrication facilities…
As Industrialization system engineer you will drive the development of Nearfield Instruments products by translating the overall system design into an architecture that meets the critical industrialization requirements…
Nearfield Instruments brings together the most creative minds in science and technology to develop revolutionary high-throughput Scanning Probe Microscopy (SPM) systems, enabling atom-scale resolution 3D metrology at…