ATE Test Engineer
Summary
ATE Test Engineer responsible for characterizing new designs, debugging issues, analyzing test data, and writing/debugging test codes for semiconductor devices. Focuses on wafer sort and final test solutions using specialized ATE systems and statistical analysis tools.
Job Description
· Expertise level in V93K SMT7 & SMT8
· Any Block levelexperience: (PROCESSOR, SENSOR, Q6, FUNCTIONAL PHASING, BSDL/JTAG, DC Char,INTEGRATION/TEST PROGRAM OWNER, MSIP, SLT ATE, SLT BENCH)
· Responsiblein Characterizing of new design across temp and to assess whether theparameterlies with in spec.
· Feasiblestudy of the product and provide a test plan solution for Wafer Sort and FinalTest.
· Responsibleto debug and root cause the design issue and work with the designer toidentifythe issue.
· Responsibleon analyzing the volume data at FT and WS and provide the spec to screenthedevice.
· Expertisein LabView or hands on experience with Teradyne IFlex/UFlex or/and Advantest 93ATE is a plus.
· GoodASIC device level characterization skills
· Ableto work comfortably with lab equipment like Oscilloscopes, Source Meters,Battery Emulators, Spectrum analyzers, etc.
· Strongsoftware skills (VB, Perl, Java, etc.) for writing and debugging test codes.
· Experiencein Six Sigma Statistical Process Control
Requirements:-
· Qualification:2 to 5+ Years Experience, Degree in Electrical / Electronics
· NoOf Position: 3 Preferred: Singapore Citizens / SPRs
JobRequirements:
· UniversityEngineering Degree in Electrical / Electronic discipline with a basicunderstanding of electronics engineering fundamentals and circuit analysis
· Knowledgeand hands on experience with statistical analysis software package andtechniques, quality and reliability testing. Wafer fabrication fundamentals area plus.
· Solidunderstanding of electronics engineering fundamentals, digital, analog,mixed-signal, power management and RF circuit analysis techniques
· Workingknowledge of Power Management IC (PMIC) measurement techniques such asline/load regulation, PSRR, transition time, power efficiency, jitter, phasenoise, etc.