Design Testability Engineer(DFT Engineer)
Posted Updated
Candidates are evaluated across five primary areas:
Scan Insertion / Scan Architecture
ATPG – Automatic Test Pattern Generation
GLS – Gate Level Simulation
JTAG / IJTAG / Boundary Scan
MBIST – Memory Built-In Self-Test
Scan Insertion / Scan Architecture
ATPG – Automatic Test Pattern Generation
GLS – Gate Level Simulation
JTAG / IJTAG / Boundary Scan
MBIST – Memory Built-In Self-Test
